Please use this identifier to cite or link to this item:
http://hdl.handle.net/123456789/371| Title: | Charge erasure analysis on the nanoscale using Kelvin probe force microscopy |
| Authors: | Shi-quan Lin |
| Issue Date: | 2017 |
| URI: | http://hdl.handle.net/123456789/371 |
| Appears in Collections: | E-JOURNALS |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| nanoscale.pdf | 10.46 MB | Adobe PDF | View/Open |
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